Mueller matrix imaging microscope using dual continuously rotating anisotropic mirrors
نویسندگان
چکیده
We demonstrate calibration and operation of a Mueller matrix imaging microscope using dual continuously rotating anisotropic mirrors for polarization state generation analysis. The contain highly spatially coherent nanostructure slanted columnar titanium thin films deposited onto optically thick layers on quartz substrates. first mirror acts as image generator the second detector. instrument is calibrated samples consisting laterally homogeneous properties such straight-through-air, clear aperture linear polarizer, retarder waveplate. images are determined varying commercially available (Thorlabs) birefringent resolution target patterned film glass substrate. Calibration demonstrated at single wavelength (530 nm) only, while, in principle, can operate regardless wavelength. refer to this ellipsometry configuration rotating-anisotropic-mirror-sample-rotating-anisotropic-mirror (RAM-S-RAM-E).
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ژورنال
عنوان ژورنال: Optics Express
سال: 2021
ISSN: ['1094-4087']
DOI: https://doi.org/10.1364/oe.435972